发明授权
- 专利标题： Calculating distortion summaries for circuit distortion analysis
- 专利标题（中）： 计算电路失真分析的失真概要
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申请号： US12484865申请日： 2009-06-15
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公开(公告)号： US07979837B1公开(公告)日： 2011-07-12
- 发明人: Fangyi Rao , Dan Feng
- 申请人： Fangyi Rao , Dan Feng
- 申请人地址： US CA San Jose
- 专利权人： Cadence Design Systems, Inc.
- 当前专利权人： Cadence Design Systems, Inc.
- 当前专利权人地址： US CA San Jose
- 代理机构： Schwegman, Lundberg & Woessner, P.A.
- 主分类号： G06F17/50
- IPC分类号： G06F17/50 ; G06F9/45 ; G06F11/22
摘要：
Methods for analyzing circuit distortion based on contributions from separate circuit elements are presented. Local approximations that do not require high-order derivatives of device models are developed near an operating point for calculating distortion summaries including compression summaries and second-order intermodulation (IM2) distortion summaries.
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