A configurable semiconductor device includes at least one select pin configured to connect to one of a plurality of impedances. The impedances are external to the configurable semiconductor device and have impedance values within predetermined tolerances. A measurement circuit is connected to the at least one select pin. The measurement circuit is configured to measure electrical characteristics of the plurality of impedances, correlate the electrical characteristics to respective predetermined ranges of impedances, and generate digital output values corresponding to the correlation. A controller is configured to control a characteristic of the configurable semiconductor device based on the digital output values. Spacing between the respective predetermined ranges of impedances is based on the predetermined tolerances.