发明授权
US07978491B2 Stacked memory cell structure and method of forming such a structure
有权
堆叠的存储单元结构和形成这种结构的方法
- 专利标题: Stacked memory cell structure and method of forming such a structure
- 专利标题(中): 堆叠的存储单元结构和形成这种结构的方法
-
申请号: US12010651申请日: 2008-01-28
-
公开(公告)号: US07978491B2公开(公告)日: 2011-07-12
- 发明人: Hasan Nejad , Mirmajid Seyyedy
- 申请人: Hasan Nejad , Mirmajid Seyyedy
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Dickstein Shapiro LLP
- 主分类号: G11C7/02
- IPC分类号: G11C7/02
摘要:
This invention relates to memory technology and new variations on memory array architecture to incorporate certain advantages from both cross-point and 1T-1Cell architectures. The fast read-time and higher signal-to-noise ratio of the 1T-1Cell architecture and the higher packing density of the cross-point architecture are both exploited by combining certain characteristics of these layouts. A single access transistor 16 is used to read multiple memory cells, which can be stacked vertically above one another in a plurality of memory array layers arranged in a “Z” axis direction.
公开/授权文献
- US20080180982A1 Stacked 1T-nmemory cell structure 公开/授权日:2008-07-31
信息查询