发明授权
- 专利标题: Electromagnetic wave measuring method and electromagnetic wave measuring apparatus
- 专利标题(中): 电磁波测量方法和电磁波测量仪器
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申请号: US12141510申请日: 2008-06-18
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公开(公告)号: US07924232B2公开(公告)日: 2011-04-12
- 发明人: Shoichi Kajiwara , Hiroyuki Tani
- 申请人: Shoichi Kajiwara , Hiroyuki Tani
- 申请人地址: JP Osaka
- 专利权人: Panasonic Corporation
- 当前专利权人: Panasonic Corporation
- 当前专利权人地址: JP Osaka
- 代理机构: Greenblum & Bernstein, P.L.C.
- 优先权: JP2007-163777 20070621
- 主分类号: G01R29/10
- IPC分类号: G01R29/10
摘要:
An electromagnetic wave measuring method is provided that is capable of performing high-precision measurement in a shorter time and in a greater variety of frequency bands than heretofore with a comparatively simple configuration. A plate-like antenna (13) of which the outline shape of an opposed surface opposite a measured object (5) is similar to the outline shape of an opposed surface of the measured object (5) is brought close to the measured object (5), and an electromagnetic wave from the measured object (5) is measured based on the frequency spectrum of a received signal received by the plate-like antenna (13).
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