发明授权
US07902902B2 Anti-fuse repair control circuit for preventing stress on circuit parts
失效
防熔丝修复控制电路,用于防止电路部件的应力
- 专利标题: Anti-fuse repair control circuit for preventing stress on circuit parts
- 专利标题(中): 防熔丝修复控制电路,用于防止电路部件的应力
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申请号: US11964294申请日: 2007-12-26
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公开(公告)号: US07902902B2公开(公告)日: 2011-03-08
- 发明人: Shin Ho Chu , Min Jung Koh
- 申请人: Shin Ho Chu , Min Jung Koh
- 申请人地址: KR Kyoungki-do
- 专利权人: Hynix Semiconductor Inc.
- 当前专利权人: Hynix Semiconductor Inc.
- 当前专利权人地址: KR Kyoungki-do
- 代理机构: Ladas & Parry LLP
- 优先权: KR10-2007-0121942 20071128
- 主分类号: H01H85/00
- IPC分类号: H01H85/00
摘要:
The present invention relates to an anti-fuse repair control circuit which regulates transmission of a power voltage and a back-bias voltage that are converted to repair an anti-fuse to a circuit part. As such, the present invention prevents the influence of a high power voltage or a low back-bias voltage on a circuit part such as a cell, a peripheral circuit, or a core region during an anti-fuse repair. The anti-fuse repair control circuit includes an anti-fuse repair enabling part providing an anti-fuse repair enabling signal corresponding to a repair of an anti-fuse; a power voltage control part controlling transmission of a power voltage to a first circuit part according to an enablement state of the anti-fuse repair enabling signal; and a back-bias voltage control part controlling transmission of a back-bias voltage to a second circuit part according to the enablement state of the anti-fuse repair enabling signal.
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