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US07885094B2 MRAM with cross-tie magnetization configuration 有权
具有交叉磁化结构的MRAM

MRAM with cross-tie magnetization configuration
Abstract:
The incidence of half-select errors during MRAM programming has been significantly reduced by giving the free layer a shape that approximates an X so that, when the free layer switches, the magnetization in the arms of the X guides the magnetization in the central section (the X's intersection area) causing it to rotate towards the hard axis in two opposing directions. This raises the free layer's switching energy barrier, thereby reducing half-select errors.
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