发明授权
US07859664B2 Plurality of samples and method for selecting a target sample therefrom
有权
多种样品和从其中选择目标样品的方法
- 专利标题: Plurality of samples and method for selecting a target sample therefrom
- 专利标题(中): 多种样品和从其中选择目标样品的方法
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申请号: US12209260申请日: 2008-09-12
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公开(公告)号: US07859664B2公开(公告)日: 2010-12-28
- 发明人: Peter Oma , Deepak Kumar Sharma
- 申请人: Peter Oma , Deepak Kumar Sharma
- 申请人地址: CA Ottawa
- 专利权人: Brightwell Technologies Inc.
- 当前专利权人: Brightwell Technologies Inc.
- 当前专利权人地址: CA Ottawa
- 代理机构: Teitelbaum & MacLean
- 代理商 Neil Teitelbaum; Doug MacLean
- 主分类号: G01N15/02
- IPC分类号: G01N15/02
摘要:
The present invention provides a plurality of samples, each of which includes particles of a predetermined particle dimension, within narrow predetermined limits, dispersed in a carrier at a predetermined particle concentration. The predetermined particle dimension and the predetermined particle concentration are the same for each sample. However, advantageously, each sample has a different predetermined ratio of a value of an optical property of the particles to a value of the same optical property of the carrier. The present invention also provides a method for selecting a target sample from the plurality of samples to assess the measurement accuracy or the detection sensitivity of an optical particle analyzer as the predetermined ratio approaches 1.
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