发明授权
- 专利标题: Baseline comparative leading indicator analysis
- 专利标题(中): 基线比较领先指标分析
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申请号: US12006754申请日: 2007-12-20
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公开(公告)号: US07797130B1公开(公告)日: 2010-09-14
- 发明人: Eric J. Silberg , Phong Hua Nguyen , Daniel P. Everson , Naipei P. Bi
- 申请人: Eric J. Silberg , Phong Hua Nguyen , Daniel P. Everson , Naipei P. Bi
- 申请人地址: US DC Washington
- 专利权人: The United States of America as represented by the Secretary of the Navy
- 当前专利权人: The United States of America as represented by the Secretary of the Navy
- 当前专利权人地址: US DC Washington
- 代理商 Howard Kaiser
- 主分类号: G06F17/18
- IPC分类号: G06F17/18
摘要:
According to typical inventive practice, a baseline describing a statistical distribution is established for a set of historical occurrences of an event. Comparison is made between the baseline and at least one current occurrence of the same event. Any current occurrence that is anomalous vis-à-vis the baseline is considered a possible leading indicator. According to some inventive embodiments of graphical presentation of such comparison, at least one graphical baseline comparative display component is rendered that includes a “bar” (describing a historical statistical distribution with respect to a criterion pertaining to occurrence of an event) and a “slider” (describing one or more current occurrences of the event). The bar includes at least one band representing a statistical mean range, and at least one band representing a statistical outlier range. Situation of the slider along the bar indicates whether and to what extent the current occurrence(s) is/are anomalous vis-à-vis the baseline.
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