发明授权
- 专利标题： Method of measuring amount of eccentricity
- 专利标题（中）： 测量偏心量的方法
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申请号： US12732836申请日： 2010-03-26
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公开(公告)号： US07792366B1公开(公告)日： 2010-09-07
- 发明人: Zongtao Ge , Kenichi Takahashi
- 申请人： Zongtao Ge , Kenichi Takahashi
- 申请人地址： JP Saitama-shi
- 专利权人： Fujinon Corporation
- 当前专利权人： Fujinon Corporation
- 当前专利权人地址： JP Saitama-shi
- 代理机构： Birch, Stewart, Kolasch & Birch, LLP
- 优先权： JPP2009-080213 20090327
- 主分类号： G06K9/62
- IPC分类号： G06K9/62 ; G01B9/00
摘要：
An optical element to be measured is irradiated with the light which has passed through an indicator, thereby to form an indicator image on an image pick-up surface. Maximum peak coordinates are specified and stored as a position of the indicator image relating to the first surface. Whether the second largest peak may be specified or not is determined. In case that this result is NO, the maximum peak indicator image is deleted, and maximum peak coordinates are specified again and stored as a position of the indicator image relating to the second surface.
公开/授权文献
- US20100245804A1 METHOD OF MEASURING AMOUNT OF ECCENTRICITY 公开/授权日：2010-09-30
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