发明授权
- 专利标题: Non-volatile memory structure
- 专利标题(中): 非易失性存储器结构
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申请号: US12379202申请日: 2009-02-17
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公开(公告)号: US07760564B2公开(公告)日: 2010-07-20
- 发明人: Te-Wei Chen
- 申请人: Te-Wei Chen
- 申请人地址: TW Hsinchu County
- 专利权人: Siliconmotion Inc.
- 当前专利权人: Siliconmotion Inc.
- 当前专利权人地址: TW Hsinchu County
- 代理机构: Rosenberg, Klein & Lee
- 优先权: TW95123218A 20060627
- 主分类号: G11C11/00
- IPC分类号: G11C11/00
摘要:
A non-volatile memory array structure includes N bit lines, M first word lines, M×N first memory cells, a second word line, n repair circuits and a sense amplifier. The N bit lines and M first word lines are interlaced to control the M×N first memory cell. The second word line is placed across the n bit lines. Each of the repair circuits is electrically connected between the corresponding bit line and the sense amplifier. M and N are natural number.
公开/授权文献
- US20090147601A1 Non-volatile memory structure 公开/授权日:2009-06-11
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