发明授权
- 专利标题: PRAM and method of firing memory cells
- 专利标题(中): PRAM和烧存存储单元的方法
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申请号: US11933536申请日: 2007-11-01
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公开(公告)号: US07746688B2公开(公告)日: 2010-06-29
- 发明人: Hye-jin Kim , Kwang-jin Lee , Du-eung Kim , Woo-yeong Cho , Chang-han Choi , Ki-won Lim
- 申请人: Hye-jin Kim , Kwang-jin Lee , Du-eung Kim , Woo-yeong Cho , Chang-han Choi , Ki-won Lim
- 申请人地址: KR Suwon-si, Gyeonggi-do
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-si, Gyeonggi-do
- 代理机构: Volentine & Whitt, PLLC
- 优先权: KR10-2006-0110059 20061108
- 主分类号: G11C11/00
- IPC分类号: G11C11/00
摘要:
A PRAM includes a memory cell array of phase change memory cells, and a write circuit receiving an externally provided first voltage and supplying a write pulse for writing data to the memory cells in a normal operation mode. The write circuit also receives an externally provided second voltage higher than the first voltage and supplies a firing pulse to at least one firing-failed phase change memory cell.
公开/授权文献
- US20080106930A1 PRAM AND METHOD OF FIRING MEMORY CELLS 公开/授权日:2008-05-08
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