发明授权
- 专利标题： Semiconductor device with decoupling capacitance controlled and control method for the same
- 专利标题（中）： 具有去耦电容的半导体器件控制和控制方法相同
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申请号： US11847768申请日： 2007-08-30
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公开(公告)号： US07733164B2公开(公告)日： 2010-06-08
- 发明人: Takashi Umamichi , Katsunori Shirai
- 申请人： Takashi Umamichi , Katsunori Shirai
- 申请人地址： JP Kanagawa
- 专利权人： NEC Electronics Corporation
- 当前专利权人： NEC Electronics Corporation
- 当前专利权人地址： JP Kanagawa
- 代理机构： Sughrue Mion, PLLC
- 优先权： JP2006-237698 20060901
- 主分类号： H03B1/00
- IPC分类号： H03B1/00 ; H03K5/00 ; H04B1/10
摘要：
In a semiconductor device, a monitoring circuit monitors and detects a quantity of noise in the semiconductor device. A control circuit has capacitances and controls connections to the capacitances such a decoupling capacitance value provided between a first power supply and a second power supply is dynamically adjusted based on the detected noise quantity.
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