Invention Grant
- Patent Title: Mass spectrometric system and mass spectrometry
- Patent Title (中): 质谱系统和质谱
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Application No.: US10549587Application Date: 2004-03-15
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Publication No.: US07586091B2Publication Date: 2009-09-08
- Inventor: Katsutoshi Takahashi , Kazuhiro Iida , Masakazu Baba , Noriyuki Iguchi , Toru Sano , Hisao Kawaura , Toshitsugu Sakamoto , Wataru Hattori , Hiroko Someya
- Applicant: Katsutoshi Takahashi , Kazuhiro Iida , Masakazu Baba , Noriyuki Iguchi , Toru Sano , Hisao Kawaura , Toshitsugu Sakamoto , Wataru Hattori , Hiroko Someya
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: Scully, Scott, Murphy & Presser, P.C.
- Priority: JP2003-069793 20030314
- International Application: PCT/JP2004/003427 WO 20040315
- International Announcement: WO2004/081555 WO 20040923
- Main IPC: H01J49/00
- IPC: H01J49/00

Abstract:
After a sample is previously separated into plural components in a channel formed in a microchip (353), the channel is irradiated along a separation direction with a laser beam from a laser oscillator (361) to sequentially ionize each fraction separated in the channel. The ionized fraction is detected by a mass spectrometry unit (363) and analyzed by an analytical result analyzing unit (371). The analytical result is stored in a memory (369) while associated with position information in a driver control unit (367) and information on laser beam irradiation condition in a laser control unit (373), and the analytical result is imaged by an imaging unit (375). The imaged analytical result is displayed on a display (377).
Public/Granted literature
- US20060214101A1 Mass spectrometric system and mass spectrometry Public/Granted day:2006-09-28
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