Invention Grant
- Patent Title: Method for forming porous insulation film
- Patent Title (中): 形成多孔绝缘膜的方法
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Application No.: US11604598Application Date: 2006-11-27
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Publication No.: US07585789B2Publication Date: 2009-09-08
- Inventor: Yasuyoshi Hyodo , Kazuo Kohmura , Nobutoshi Fujii , Nobutaka Kunimi , Keizo Kinoshita
- Applicant: Yasuyoshi Hyodo , Kazuo Kohmura , Nobutoshi Fujii , Nobutaka Kunimi , Keizo Kinoshita
- Applicant Address: JP Tokyo JP Kanagawa JP Tokyo
- Assignee: ASM Japan K.K.,Ulvac, Inc.,NEC Corporation
- Current Assignee: ASM Japan K.K.,Ulvac, Inc.,NEC Corporation
- Current Assignee Address: JP Tokyo JP Kanagawa JP Tokyo
- Agency: Knobbe Martens Olson & Bear LLP
- Priority: JP2005-342154 20051128
- Main IPC: H01L21/31
- IPC: H01L21/31 ; H01L21/469

Abstract:
A method of forming a porous film on a semiconductor substrate includes: supplying a silicon compound containing at least one Si—O bond in its molecule in a gaseous phase into a reaction chamber; forming a siloxane oligomer through plasma reaction of the silicon compound; and supplying an organic amine in a gaseous phase into the reaction chamber and reacting the organic amine with the siloxane oligomer, thereby forming a porous film on the semiconductor substrate.
Public/Granted literature
- US20070158013A1 Method for forming porous insulation film Public/Granted day:2007-07-12
Information query
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