Invention Grant
- Patent Title: Reticle and optical proximity correction method
- Patent Title (中): 光栅和光学邻近校正方法
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Application No.: US11164127Application Date: 2005-11-10
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Publication No.: US07527900B2Publication Date: 2009-05-05
- Inventor: Wen-Zhan Zhou , Jin Yu , Kai-Hung Alex See
- Applicant: Wen-Zhan Zhou , Jin Yu , Kai-Hung Alex See
- Applicant Address: TW Hsin-Chu
- Assignee: United Microelectronics Corp.
- Current Assignee: United Microelectronics Corp.
- Current Assignee Address: TW Hsin-Chu
- Agent Winston Hsu
- Main IPC: G03F1/00
- IPC: G03F1/00

Abstract:
An OPC method includes providing a primary mask having a primary pattern, forming an assist mask having a correction pattern substantially complementary to the primary pattern, and forming a reticle by overlapping the primary mask and the assist mask. The light transmittance of the correction pattern is adjustable so as to equalize the light intensity distribution of the primary mask.
Public/Granted literature
- US20070105023A1 RETICLE AND OPTICAL PROXIMITY CORRECTION METHOD Public/Granted day:2007-05-10
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