发明授权
US07459897B2 Terminator circuit, test apparatus, test head, and communication device
失效
终端电路,测试仪器,测试头和通讯设备
- 专利标题: Terminator circuit, test apparatus, test head, and communication device
- 专利标题(中): 终端电路,测试仪器,测试头和通讯设备
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申请号: US11706572申请日: 2007-02-14
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公开(公告)号: US07459897B2公开(公告)日: 2008-12-02
- 发明人: Toshiaki Awaji , Takashi Sekino
- 申请人: Toshiaki Awaji , Takashi Sekino
- 申请人地址: JP Tokyo
- 专利权人: Advantest Corporation
- 当前专利权人: Advantest Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Osha•Liang LLP
- 优先权: JP2004-236432 20040816
- 主分类号: G01R19/00
- IPC分类号: G01R19/00 ; G01R27/08
摘要:
The present invention provides a terminator circuit including a potential variation detecting section that detects a variation in a potential at an end point to which an input signal is supplied, and a first current generating section that reduces an overshoot at the end point which is caused by the application of the input signal, by pulling a current from the end point, when the potential variation detecting section detects a rise in the potential at the end point. Here, the potential variation detecting section includes a comparison potential generating section that generates a comparison potential based on a reference potential, and a potential comparing section that compares the comparison potential which has risen in accordance with the rise in the potential at the end point, with the reference potential, and outputs a result of the comparison.
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