发明授权
US07445672B2 Method of forming group-III nitride crystal, layered structure and epitaxial substrate
有权
形成III族氮化物晶体,层状结构和外延衬底的方法
- 专利标题: Method of forming group-III nitride crystal, layered structure and epitaxial substrate
- 专利标题(中): 形成III族氮化物晶体,层状结构和外延衬底的方法
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申请号: US11503831申请日: 2006-08-14
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公开(公告)号: US07445672B2公开(公告)日: 2008-11-04
- 发明人: Tomohiko Shibata
- 申请人: Tomohiko Shibata
- 申请人地址: JP Nagoya JP Chiyoda-Ku
- 专利权人: NGK Insulators, Ltd.,Dowa Mining Co., Ltd.
- 当前专利权人: NGK Insulators, Ltd.,Dowa Mining Co., Ltd.
- 当前专利权人地址: JP Nagoya JP Chiyoda-Ku
- 代理机构: Burr & Brown
- 优先权: JP2005-237587 20050818
- 主分类号: C30B25/12
- IPC分类号: C30B25/12 ; C30B25/14
摘要:
Heat treatment is conducted at a predetermined temperature of not less than 1250° C. on an underlying substrate obtained by epitaxially forming a first group-III nitride crystal on a predetermined base as an underlying layer. Three-dimensional fine irregularities resulting from crystalline islands are created on the surface of the underlying layer. A second group-III nitride crystal is epitaxially formed on the underlying substrate as a crystal layer. There are a great many fine voids interposed at the interface between the crystal layer and underlying substrate. The presence of such voids suppresses propagation of dislocations from the underlying substrate, which reduces the dislocation density in the crystal layer. As a result, the crystal layer of good crystal quality can be obtained.
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