Invention Grant
- Patent Title: High frequency delay circuit and test apparatus
- Patent Title (中): 高频延迟电路和测试仪器
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Application No.: US11101157Application Date: 2005-04-07
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Publication No.: US07394238B2Publication Date: 2008-07-01
- Inventor: Katsumi Ochiai , Takashi Sekino
- Applicant: Katsumi Ochiai , Takashi Sekino
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Osha Liang LLP
- Priority: JP2003-398817 20031128
- Main IPC: H03H11/26
- IPC: H03H11/26 ; G01R27/28

Abstract:
A high frequency delay circuit operable to output a high frequency signal delayed for a desired delay time. The high frequency delay circuit includes: a variable delay circuit operable to receive a reference signal of which a frequency is lower than the high frequency signal, and to output a delay reference signal delayed from the reference signal for the desired delay time in advance; and a multiplier operable to generate the high frequency signal, of which a frequency is a frequency of the delay reference signal multiplied by a predetermined value, and to output the generated high frequency signal at timing according to a phase of the delay reference signal.
Public/Granted literature
- US20050225330A1 High frequency delay circuit and test apparatus Public/Granted day:2005-10-13
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