Invention Grant
- Patent Title: Contour inspection method and apparatus
- Patent Title (中): 轮廓检查方法和装置
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Application No.: US09974539Application Date: 2001-10-09
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Publication No.: US07352901B2Publication Date: 2008-04-01
- Inventor: Shiro Fujieda
- Applicant: Shiro Fujieda
- Applicant Address: JP Kyoto
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto
- Agency: Beyer Weaver LLP
- Main IPC: G06K9/48
- IPC: G06K9/48 ; G06K9/40

Abstract:
Defects in the contour of a target object is detected by obtaining an digital variable-density image of the contour and edges are extracted from the image of the contour so as to sequentially represent the contour. Their directions are measured and the direction of each edge is compared with those of other edges selected according to their distances from the edge under consideration. The differential is indicative of the presence or absence of an indentation or a protrusion in the contour, representing a defect.
Public/Granted literature
- US20020049560A1 Contour inspection method and apparatus Public/Granted day:2002-04-25
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