发明授权
- 专利标题: Scanning probe microscope
- 专利标题(中): 扫描探针显微镜
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申请号: US11076250申请日: 2005-03-09
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公开(公告)号: US07284415B2公开(公告)日: 2007-10-23
- 发明人: Yoshiteru Shikakura , Kazutoshi Watanabe
- 申请人: Yoshiteru Shikakura , Kazutoshi Watanabe
- 申请人地址: JP
- 专利权人: SII NanoTechnology Inc.
- 当前专利权人: SII NanoTechnology Inc.
- 当前专利权人地址: JP
- 代理机构: Adams & Wilks
- 优先权: JP2004-068476 20040311
- 主分类号: G01B5/28
- IPC分类号: G01B5/28 ; G01N13/16
摘要:
A scanning probe microscope has a cantilever having a minute probe on a distal end thereof and a displacement detecting device for detecting displacement of the cantilever. A Z-axis controlling amount calculating mechanism calculates a controlling amount for keeping constant a displacement amount of the cantilever. A Z-axis driving mechanism drives in a Z direction the cantilever or a sample in accordance with the controlling amount from the Z-axis controlling amount calculating mechanism. An XY scanning mechanism relatively moves the probe in a direction of an XY plane with respect to the sample to measure an uneven shape and/or a physical characteristic of the surface of the sample. A controlling range limiting device limits a driving range of the Z-axis driving mechanism. A controlling range setting device optionally sets the driving range of the Z-axis driving mechanism.
公开/授权文献
- US20050199046A1 Scanning probe microscope 公开/授权日:2005-09-15
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