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US07273407B2 Transparent polishing pad 有权
透明抛光垫

Transparent polishing pad
摘要:
The present invention relates to a polishing pad useful for planarizing a substrate in a CMP process using a polishing composition. The polishing pad is transparent and allows for the use of an in-situ optical end-point detection apparatus without the need for a separate aperture or window in the polishing pad.
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