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US07236555B2 Method and apparatus for measuring jitter 有权
用于测量抖动的方法和装置

Method and apparatus for measuring jitter
Abstract:
In a method for measuring jitter, a signal under test is inputted to generate signal transition locations. A signal transition location is latched using a sampling clock signal, and the signal transition location is converted to a delay value. The delay value is converted to an edge position output, and a value of the edge position output is detected.
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