Invention Grant
- Patent Title: Differential comparator circuit, test head, and test apparatus
- Patent Title (中): 差分比较电路,测试头和测试仪器
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Application No.: US11202391Application Date: 2005-08-11
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Publication No.: US07123025B2Publication Date: 2006-10-17
- Inventor: Toshiaki Awaji , Takashi Sekino
- Applicant: Toshiaki Awaji , Takashi Sekino
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Osha Liang LLP
- Priority: JP2004-236808 20040816
- Main IPC: G01R27/28
- IPC: G01R27/28

Abstract:
There is provided a differential comparator circuit that is mounted on a test apparatus for testing a device under test outputting differential signals including noninverted signals and inverted signals. The differential comparator circuit includes: a difference signal subtracting circuit operable to compute and output a difference signal indicative of a difference between the noninverted signal and the inverted signal; a first threshold value subtracting circuit operable to compute and output a first threshold voltage indicative of a difference between a first comparative voltage generated based on ground potential of the device under test and a reference voltage generated based on the ground potential of the device under test; and a first comparing circuit operable to compare the difference signal and the first threshold voltage to output a comparison result.
Public/Granted literature
- US20060033509A1 Differential comparator circuit, test head, and test apparatus Public/Granted day:2006-02-16
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