发明授权
- 专利标题： Speckle interferometer apparatus
- 专利标题（中）： 散斑干涉仪
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申请号： US10779599申请日： 2004-02-18
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公开(公告)号： US07092104B2公开(公告)日： 2006-08-15
- 发明人: Masatoshi Hizuka , Hideo Kanda , Takayuki Saito
- 申请人： Masatoshi Hizuka , Hideo Kanda , Takayuki Saito
- 申请人地址： JP Saitama
- 专利权人： Fujinon Corporation
- 当前专利权人： Fujinon Corporation
- 当前专利权人地址： JP Saitama
- 代理机构： Snider & Associates
- 代理商 Ronald R. Snider
- 优先权： JP2003-063709 20030310
- 主分类号： G01B11/02
- IPC分类号： G01B11/02
摘要：
In a speckle interferometer apparatus 2, an optical member mounting device 10 mounted with optical members including a pair of luminous flux outputting devices 9a, 9b, 9c, 9d is disposed on the object side of a main unit of an imaging device 3 while being separated from the imaging device 3. A light-transmitting area 14 is formed between the pair of luminous flux outputting devices 9a, 9b, 9c, 9d so as to transmit therethrough interference light from an object surface.
公开/授权文献
- US20040179204A1 Speckle interferometer apparatus 公开/授权日：2004-09-16
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