Invention Grant
- Patent Title: Input-output circuit and a testing apparatus
- Patent Title (中): 输入输出电路和测试仪器
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Application No.: US10757304Application Date: 2004-01-14
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Publication No.: US07013230B2Publication Date: 2006-03-14
- Inventor: Takashi Sekino
- Applicant: Takashi Sekino
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Osha•Liang LLP
- Priority: JP2001-216792 20010717
- Main IPC: G06F19/00
- IPC: G06F19/00

Abstract:
An input-output circuit sending and/or receiving a signal to and/or from an electronic device includes a driver for supplying a signal to the electronic device, a comparator provided parallel to the driver for receiving a signal from the electronic device, a relaying circuit provided between the comparator the electronic device in series with the comparator and the electronic device, a first transmission line for coupling the comparator and the relaying circuit electrically and a first switch for selecting either of short or open-circuited state of the first transmission line and the electronic device, wherein the impedance of the relaying circuit is larger than the impedance of the first transmission line.
Public/Granted literature
- US20040145375A1 Input-output circuit and a testing apparatus Public/Granted day:2004-07-29
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