Invention Grant
- Patent Title: Position detection apparatus and method
- Patent Title (中): 位置检测装置及方法
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Application No.: US10382518Application Date: 2003-03-07
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Publication No.: US06992766B2Publication Date: 2006-01-31
- Inventor: Hiroshi Tanaka , Takuji Maruta
- Applicant: Hiroshi Tanaka , Takuji Maruta
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2002-072553 20020315; JP2003-044482 20030221
- Main IPC: G01B11/00
- IPC: G01B11/00

Abstract:
A method of detecting a position of a mark within image data. The method includes a first step of obtaining a first position of the mark based on a first degree of correlation between a first template and the image data, the first template having a first feature point to obtain the first degree of correlation, a second step of obtaining a second position of the mark based on a second degree of correlation between a second template and the image data, the second template having a second feature point, of which a position is different from that of the first feature point, to obtain the second degree of correlation, and a third step of detecting the position of the mark through the first and second steps.
Public/Granted literature
- US20030174330A1 Position detection apparatus and method Public/Granted day:2003-09-18
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