Invention Grant
US06740164B2 Plating apparatus and method of manufacturing semiconductor device 失效
电镀装置及制造半导体装置的方法

  • Patent Title: Plating apparatus and method of manufacturing semiconductor device
  • Patent Title (中): 电镀装置及制造半导体装置的方法
  • Application No.: US10058290
    Application Date: 2002-01-30
  • Publication No.: US06740164B2
    Publication Date: 2004-05-25
  • Inventor: Wataru OkaseTakenobu Matsuo
  • Applicant: Wataru OkaseTakenobu Matsuo
  • Priority: JPP2001-021619 20010130
  • Main IPC: H01L2144
  • IPC: H01L2144
Plating apparatus and method of manufacturing semiconductor device
Abstract:
Plating apparatus and plating method that can plate more uniformly on a processing surface of a workpiece are provided. The plating apparatus is comprised of a plating solution bathe which is provided with a first electrode held in a state soaked in a plating solution; a workpiece holding mechanism which holds a workpiece to contact its processing surface to the plating solution; and a contact member, disposed in the workpiece holding mechanism, that electrically contacts with the circumferential edge of the workpiece so to form a conductive layer on the workpiece surface as a second electrode. The contact member is divided along the circumferential direction of the workpiece with which they are electrically contacted. Thus, even if the contact resistance between each section of the contact member with the workpiece is variable, it is possible to adjust the plating electric current for each section of the contact member.
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