Invention Grant
- Patent Title: Mask set for compensating a misalignment between patterns
- Patent Title (中): 用于补偿图案之间的未对准的掩模集
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Application No.: US08991261Application Date: 1997-12-16
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Publication No.: US06713883B1Publication Date: 2004-03-30
- Inventor: Soon Won Hong , Tae Hum Yang
- Applicant: Soon Won Hong , Tae Hum Yang
- Priority: KR96-66119 19961216
- Main IPC: H01L23544
- IPC: H01L23544

Abstract:
The present invention discloses a mask set for compensating for a misalignment between the patterns and method of compensating for a misalignment between the patterns. A mask set of the present invention comprises a first mask consisted of a mask substrate on which a main pattern and a plurality of sub-patterns are formed, said sub-patterns formed at a side of the main pattern; a second mask consisted of a mask substrate on which a plurality of hole patterns are formed, the hole patterns corresponded to spaces between the main pattern and the sub-patterns of the first mask, respectively when the first and second mask are overlapped to each other; and a third mask consisted of mask substrate on which a plurality of bar patterns are formed, the bar patterns corresponded to the hole patterns of the second mask, respectively when the second and third mask are overlapped to each other.
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