Invention Grant
US06713883B1 Mask set for compensating a misalignment between patterns 失效
用于补偿图案之间的未对准的掩模集

  • Patent Title: Mask set for compensating a misalignment between patterns
  • Patent Title (中): 用于补偿图案之间的未对准的掩模集
  • Application No.: US08991261
    Application Date: 1997-12-16
  • Publication No.: US06713883B1
    Publication Date: 2004-03-30
  • Inventor: Soon Won HongTae Hum Yang
  • Applicant: Soon Won HongTae Hum Yang
  • Priority: KR96-66119 19961216
  • Main IPC: H01L23544
  • IPC: H01L23544
Mask set for compensating a misalignment between patterns
Abstract:
The present invention discloses a mask set for compensating for a misalignment between the patterns and method of compensating for a misalignment between the patterns. A mask set of the present invention comprises a first mask consisted of a mask substrate on which a main pattern and a plurality of sub-patterns are formed, said sub-patterns formed at a side of the main pattern; a second mask consisted of a mask substrate on which a plurality of hole patterns are formed, the hole patterns corresponded to spaces between the main pattern and the sub-patterns of the first mask, respectively when the first and second mask are overlapped to each other; and a third mask consisted of mask substrate on which a plurality of bar patterns are formed, the bar patterns corresponded to the hole patterns of the second mask, respectively when the second and third mask are overlapped to each other.
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