发明授权
US06617580B2 Electron holography microscope 失效
电子全息显微镜

  • 专利标题: Electron holography microscope
  • 专利标题(中): 电子全息显微镜
  • 申请号: US10036189
    申请日: 2001-12-27
  • 公开(公告)号: US06617580B2
    公开(公告)日: 2003-09-09
  • 发明人: Edgar Voelkl
  • 申请人: Edgar Voelkl
  • 主分类号: G21K700
  • IPC分类号: G21K700
Electron holography microscope
摘要:
Systems and methods are described for an electron holography microscopy. Changing a size of an electron object image includes maintaining rotation of the electron object image with respect to a final image plane and/or maintaining an aspect ratio defined by an astigmatic object illumination with respect to the final image plane constant by adjusting a condenser electron lens set
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