A method for generating charge sharing test vectors for a circuit generates a first test vector (120) and a second test vector (122). The method provides a test model (98) including a logic cell (10) and an auxiliary test circuit (100) where the auxiliary test circuit (100) includes a discharge AND gate (102) and a charge sharing AND gate (104). The method generates a first test vector (120) for the test model (98) having an input pattern to discharge nodes of the logic cell (10) and evaluate discharge AND gate (102) to a logic level 1. The method generates a second test vector (122) having an input pattern to evoke the worst charge sharing behavior for the logic cell (10) and evaluate charge sharing AND gate (104) to a logic level 1.