Invention Grant
- Patent Title: System and method of selecting and using bit testing sequences during successive approximation for calibrating an analog-to-digital converter
- Patent Title (中): 在逐次逼近期间选择和使用位测试序列以校准模数转换器的系统和方法
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Application No.: US09393091Application Date: 1999-09-09
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Publication No.: US06404375B1Publication Date: 2002-06-11
- Inventor: Carlos Esteban Muñoz , Karl Ernesto Thompson , Douglas S. Piasecki , Wai Laing Lee , Eric Swanson
- Applicant: Carlos Esteban Muñoz , Karl Ernesto Thompson , Douglas S. Piasecki , Wai Laing Lee , Eric Swanson
- Main IPC: H03M112
- IPC: H03M112

Abstract:
A digital calibration system for an analog-to-digital converter system includes a computational system receiving digital bits from an analog-to-digital converter representing selection of elements of the digital-to-analog converter in response to an analog input. The computational engine produces a digital output representative of the analog input during conversion operation, and digital values for adjustment of an adjustable analog source during calibration. Further, a digital system comprises a radix-less-than-two non-configurable digital-to-analog converter, a comparator system connected to the converter, and a computational system configured for SAR calibration and conversion.
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