发明授权
US06272061B1 Semiconductor integrated circuit device having fuses and fuse latch circuits
失效
具有保险丝和熔丝锁存电路的半导体集成电路器件
- 专利标题: Semiconductor integrated circuit device having fuses and fuse latch circuits
- 专利标题(中): 具有保险丝和熔丝锁存电路的半导体集成电路器件
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申请号: US09652158申请日: 2000-08-31
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公开(公告)号: US06272061B1公开(公告)日: 2001-08-07
- 发明人: Daisuke Kato , Yohji Watanabe
- 申请人: Daisuke Kato , Yohji Watanabe
- 优先权: JP11-249179 19990902
- 主分类号: G11C700
- IPC分类号: G11C700
摘要:
A semiconductor integrated circuit device has a semiconductor integrated circuit with first layout sections where fuses are laid out and second layout sections where fuse latch circuits, which correspond to the fuses, are laid out. The first layout sections are disposed in a first repetition pitch in a fuse area, while the second layout sections are laid out at a second repetition pitch smaller than the first repetition pitch in a fuse latch circuit area. A third layout section is laid out in a space caused by the difference between the first and second repetition pitches. In the third layout section, at least one of patterns which are unrepeatable in each of the second layout sections and the patterns which do not need to be repeated in each of the second layout sections.
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