Invention Grant
- Patent Title: Method and arrangement for detecting X-rays
- Patent Title (中): 检测X射线的方法和装置
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Application No.: US09332123Application Date: 1999-06-14
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Publication No.: US06195413B1Publication Date: 2001-02-27
- Inventor: George Geus , Martin Hartick , Patricia Schall
- Applicant: George Geus , Martin Hartick , Patricia Schall
- Priority: DE19826062 19980612
- Main IPC: G01N2306
- IPC: G01N2306

Abstract:
A method for detecting X-rays which are separated into individual energy ranges after penetrating an object, as well as to an arrangement for implementing this method. It is known to detect X-rays (FX) by using detection devices (3), consisting of several identically configured detector pairs. The detector pairs in that case consist of a low-energy detector (4) and a high-energy detector (7). As a result, the weakened X-ray beam (FX′) is separated into individual energy ranges following the X-raying of an object (2). This separation is necessary to determine the types of material in the X-rayed object (2). The disadvantage of known detection devices (3) is that an overlapping of the individual energy ranges occurs in the low-energy detector (4), thereby making it impossible to detect the material type with certainty. This problem is avoided by providing for computing out the high-energy shares absorbed in the low-energy detector (4) with the aid of an additional signal. For this purpose, a second low-energy detector (5) is arranged between the first low-energy detector (4) and the high-energy detector (7). An energy spectrum (FX2) that is absorbed in the second low-energy detector (5) is used to obtain the signal to be subtracted.
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