Invention Grant
US5880002A Method for making isolated vertical PNP transistor in a digital BiCMOS
process
失效
在数字BiCMOS工艺中制造隔离的垂直PNP晶体管的方法
- Patent Title: Method for making isolated vertical PNP transistor in a digital BiCMOS process
- Patent Title (中): 在数字BiCMOS工艺中制造隔离的垂直PNP晶体管的方法
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Application No.: US761293Application Date: 1996-12-06
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Publication No.: US5880002APublication Date: 1999-03-09
- Inventor: Louis N. Hutter , Jeffrey P. Smith
- Applicant: Louis N. Hutter , Jeffrey P. Smith
- Applicant Address: TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: TX Dallas
- Main IPC: H01L21/8249
- IPC: H01L21/8249 ; H01L21/331
Abstract:
A vertical PNP transistor (11) and method for making it includes forming an N- region (19) in a P substrate (12), and forming an N+ region (26) in the substrate (12) laterally surrounding and partially extending into the N- region (19). A P region (30) is formed above the N- region (19), bounded laterally by the N+ region (26) to be horizontally and vertically isolated from the substrate (12) by the N- and N+ regions (19 and 26). A layer of semiconductor material (32) is formed overall, and an N well (35) and a surrounding P well (36) are formed, each extending to the P region (30). An isolating N+ well (38) is formed surrounding the P well (36), extending to the buried N+ region (26). A P emitter region (40) and an N base contact region (41) are formed at a surface of the N well (35), and a P collector contact region (44) is formed at a surface of the P well (36). Preferably, a CMOS structure (10) may be constructed elsewhere on the substrate concurrently with at least some of the steps for making the isolated vertical PNP transistor (11). For example, in one embodiment, the step of forming a P emitter region (40), an N base contact region (41), and a P collector contact region (44) are performed as a part of the simultaneous formation of source and drain regions (47 and 48) of the CMOS structure (10) elsewhere on the substrate (12). In another embodiment, the step of forming an N base contact (54) and a P collector contact (53) are performed as a part of a simultaneous formation of source and drain regions of a CMOS structure elsewhere on the substrate. In this embodiment, a separate deeper a P emitter region (52) is formed in the N well (19) to increase the emitter X.sub.J.
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