发明授权
US5778044A X-ray examination apparatus including an image pick-up apparatus with a
correction unit
失效
X射线检查装置包括具有校正单元的图像拾取装置
- 专利标题: X-ray examination apparatus including an image pick-up apparatus with a correction unit
- 专利标题(中): X射线检查装置包括具有校正单元的图像拾取装置
-
申请号: US773118申请日: 1996-12-26
-
公开(公告)号: US5778044A公开(公告)日: 1998-07-07
- 发明人: Antonius J. C. Bruijns
- 申请人: Antonius J. C. Bruijns
- 申请人地址: NY New York
- 专利权人: U.S. Philips Corporation
- 当前专利权人: U.S. Philips Corporation
- 当前专利权人地址: NY New York
- 优先权: EPX95203645 19951227
- 主分类号: A61B6/00
- IPC分类号: A61B6/00 ; G06T1/00 ; H04N5/32 ; H04N5/365 ; H05G1/64 ; H04N1/00
摘要:
An X-ray examination apparatus includes an X-ray image intensifier for deriving an optical image from an X-ray image. The optical image is picked up by means of an image pick-up apparatus which includes a correction unit which is arranged to form a dark image signal and to derive test image signals from the optical image. Correction values are derived on the basis of the test image signals and the dark image signal. The correction unit is arranged to form a dark image signal, to derive one or more test image signals from the optical image, and to derive the correction values from said test image signals and the dark image signal. The dark image signal is picked up in the absence of incident light on the image sensor. The test image signals have a signal level which represents brightness values of the optical image which have been amplified by individual gain values.
公开/授权文献
- US4699218A Beet harvester with elevated, transverse discharge conveyor 公开/授权日:1987-10-13
信息查询