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US5757228A Output driver circuit for suppressing noise generation and integrated circuit device for burn-in test 失效
用于抑制噪声产生的输出驱动电路和用于老化测试的集成电路器件

Output driver circuit for suppressing noise generation and integrated circuit device for burn-in test
Abstract:
An improved output driver circuit for a semiconductor integrated circuit device is provided. The output driver circuit receives a type select signal (.phi.1, /.phi.1) determined by bonding selection. When a heavy load circuit is connected to an output terminal (DQ), a signal (.phi.1) of low level and a signal (/.phi.1) of high level are provided, whereby transistors (18, 19) are turned on simultaneously in response to a data signal (Mo). When a light load circuit is connected to the terminal (DQ), a signal (.phi.1) of high level and a signal (/.phi.1) of low level are provided, whereby transistors (18, 19) are turned on at a different timing. More specifically, following charging of a light load by a transistor (18) having low mutual conductance, a transistor (19) is turned on. Therefore, noise generation can be flexibly suppressed by bonding selection.
Abstract(Chinese):

提供了一种用于半导体集成电路器件的改进的输出驱动器电路。 输出驱动器电路接收通过键合选择确定的类型选择信号（phi 1，/ phi 1）。 当重负载电路连接到输出端（DQ）时，提供低电平的信号（phi 1）和高电平的信号（/ phi 1），由此晶体管（18,19）同时导通 对数据信号（Mo）的响应。 当轻负载电路连接到端子（DQ）时，提供高电平的信号（phi 1）和低电平的信号（/ phi 1），由此晶体管（18,19）以不同的方式导通 定时。 更具体地，在通过具有低互导性的晶体管（18）对轻负载充电之后，晶体管（19）导通​​。 因此，可以通过接合选择灵活地抑制噪声产生。

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