Invention Grant
- Patent Title: Process for the characterization of an insulator and the corresponding electron microscope
- Patent Title (中): 绝缘子表征方法及相应的电子显微镜
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Application No.: US448376Application Date: 1996-06-18
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Publication No.: US5635715APublication Date: 1997-06-03
- Inventor: Claude Le Gressus , Claude Faure , Daniel Acroute , Jose Bezille , Hakim Janah , Gerard Moya , Guy Blaise
- Applicant: Claude Le Gressus , Claude Faure , Daniel Acroute , Jose Bezille , Hakim Janah , Gerard Moya , Guy Blaise
- Applicant Address: FRX Paris FRX Clichy Cedex
- Assignee: A L'Energie Atomique,Alcatel Cables
- Current Assignee: A L'Energie Atomique,Alcatel Cables
- Current Assignee Address: FRX Paris FRX Clichy Cedex
- Priority: FRX9312019 19931008
- Main IPC: G01N27/92
- IPC: G01N27/92 ; G01R31/12 ; H01J37/256
Abstract:
Process and apparatus for the characterization of an insulator (5) at breakdown with the aid of an electron microscope (1), in which the electron flow rate of the beam (3) is adjusted as a function of in particular backscattered, lost, secondary or absorbed electrons. An automatic controller (9) sensitive to certain sensors (10,12) is provided for this purpose. The electron flow rate is proportional to the voltage to be simulated in the insulator.
Public/Granted literature
- US3951963A 0-(Substituted-aminoalkyl)-5-nitroimidazole-(2)-aldoximes Public/Granted day:1976-04-20
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