Invention Grant
- Patent Title: Electron microscope specimen holder
- Patent Title (中): 电子显微镜样品架
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Application No.: US965423Application Date: 1992-10-23
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Publication No.: US5367171APublication Date: 1994-11-22
- Inventor: Takashi Aoyama , Kishu Hosoi , Yutaka Misawa , Koji Kimoto , Shigeto Isakozawa , Kazuhiro Ueda
- Applicant: Takashi Aoyama , Kishu Hosoi , Yutaka Misawa , Koji Kimoto , Shigeto Isakozawa , Kazuhiro Ueda
- Applicant Address: JPX Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JPX Tokyo
- Priority: JPX3-277450 19911024; JPX4-159133 19920618
- Main IPC: H01J37/20
- IPC: H01J37/20
Abstract:
A specimen cartridge fashioned of a good thermal conductor, with an outer frame being fashioned of heat insulating material, and with a connecting rod being fashioned of a poor thermal conductor. A temperature distribution of the specimen is uniform and a temperature drift is reduced, with a thermal expansion of a specimen cartridge tilting rod not affecting the tilting angle, thereby making it possible to perform various highly accurate observations and measurements with an electron microscope.
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