Invention Grant
- Patent Title: Apparatus for measuring characteristics of circuit elements
- Patent Title (中): 用于测量电路元件特性的装置
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Application No.: US887675Application Date: 1986-07-18
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Publication No.: US4701701APublication Date: 1987-10-20
- Inventor: Susumu Takagi
- Applicant: Susumu Takagi
- Applicant Address: CA Palo Alto
- Assignee: Hewlett-Packard Company
- Current Assignee: Hewlett-Packard Company
- Current Assignee Address: CA Palo Alto
- Priority: JPX60-159538 19850719; JPX60-170930 19850802; JPX60-170931 19850802
- Main IPC: G01R17/02
- IPC: G01R17/02 ; G01R31/26
Abstract:
An instrument for measuring the characteristics of a circuit element has a plurality of SMUs for applying test signals to the terminals of the circuit element and measuring the resulting output signals. A control circuit compares the output signal value to a reference value while varying the test signals. The test signal is varied by an integrator which operates in two modes, a search mode with no feedback to quickly bring the output signal to the approximate value of the reference, and a feedback mode to hold the output signal at the reference value while a measurement is made. The parameters for setting stable operating conditions for the feedback loop with the circuit element being tested are stored in a memory of the control circuit.
Public/Granted literature
- US5209475A Putter utilizing compound shaft as mounting for upper swivel handle support Public/Granted day:1993-05-11
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