Invention Grant
US4701701A Apparatus for measuring characteristics of circuit elements 失效
用于测量电路元件特性的装置

  • Patent Title: Apparatus for measuring characteristics of circuit elements
  • Patent Title (中): 用于测量电路元件特性的装置
  • Application No.: US887675
    Application Date: 1986-07-18
  • Publication No.: US4701701A
    Publication Date: 1987-10-20
  • Inventor: Susumu Takagi
  • Applicant: Susumu Takagi
  • Applicant Address: CA Palo Alto
  • Assignee: Hewlett-Packard Company
  • Current Assignee: Hewlett-Packard Company
  • Current Assignee Address: CA Palo Alto
  • Priority: JPX60-159538 19850719; JPX60-170930 19850802; JPX60-170931 19850802
  • Main IPC: G01R17/02
  • IPC: G01R17/02 G01R31/26
Apparatus for measuring characteristics of circuit elements
Abstract:
An instrument for measuring the characteristics of a circuit element has a plurality of SMUs for applying test signals to the terminals of the circuit element and measuring the resulting output signals. A control circuit compares the output signal value to a reference value while varying the test signals. The test signal is varied by an integrator which operates in two modes, a search mode with no feedback to quickly bring the output signal to the approximate value of the reference, and a feedback mode to hold the output signal at the reference value while a measurement is made. The parameters for setting stable operating conditions for the feedback loop with the circuit element being tested are stored in a memory of the control circuit.
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