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US4645928A Sweeping method for superimposed-field mass spectrometer 失效
扫描方法用于叠加场质谱仪

  • Patent Title: Sweeping method for superimposed-field mass spectrometer
  • Patent Title (中): 扫描方法用于叠加场质谱仪
  • Application No.: US743016
    Application Date: 1985-06-10
  • Publication No.: US4645928A
    Publication Date: 1987-02-24
  • Inventor: Motohiro Naito
  • Applicant: Motohiro Naito
  • Applicant Address: JPX Tokyo
  • Assignee: JEOL Ltd.
  • Current Assignee: JEOL Ltd.
  • Current Assignee Address: JPX Tokyo
  • Priority: JPX59-125745 19840619
  • Main IPC: G01N27/62
  • IPC: G01N27/62 H01J49/02 H01J49/32 H01J49/26
Sweeping method for superimposed-field mass spectrometer
Abstract:
Detection of unknown daughter ions using a mass spectrometer in which two mass spectrometric units are coupled together. The spectrometric unit in the front stage has either an electric field or superimposed fields. The spectrometric unit in the rear stage has superimposed fields. The voltage Vdx.sub.2 necessary to produce the electric field in the front stage and the voltage Vdx.sub.1 necessary to produce the electric field of the superimposed fields in the rear stage when daughter ions having known mass and energy are detected are found. Further, the voltage Vdx.sub.2 ' necessary to produce the electric field in the front stage and the voltage Vdx.sub.1 ' necessary to produce the electric field of the superimposed fields in the rear stage when unknown ions are detected are found. Both the mass and the energy of the unknown ions can be determined from these four voltages.
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