Invention Grant
- Patent Title: Measure value method and apparatus
- Patent Title (中): 测量方法和装置
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Application No.: US39934073Application Date: 1973-09-20
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Publication No.: US3851160APublication Date: 1974-11-26
- Inventor: HEIMPRECHT U
- Applicant: HOFMANN MASCHF GEB
- Assignee: Hofmann Maschf Geb
- Current Assignee: Hofmann Maschf Geb
- Priority: DE2250717 1972-10-16
- Main IPC: G01D1/12
- IPC: G01D1/12 ; G01D1/14 ; G01D1/18 ; G01D7/02 ; G01M15/05 ; G01R19/00 ; G01R19/10 ; G06G1/16
Abstract:
A method and apparatus for evaluating electrical measurement values derived from a test stand in which upper and lower tolerance values, stored for example on a punched card, are coverted into analog signals with the upper and lower value signals being applied to one difference forming circuit while the measurement value and one of the tolerance signals is applied to a second difference forming circuit. The resulting difference signals are divided, one into the other, and applied to an analog display.
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