Invention Application
- Patent Title: LIGHT SCATTERING MEASUREMENT BASED ON MULTIPLE LIGHT SOURCES
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Application No.: US18343423Application Date: 2023-06-28
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Publication No.: US20250003853A1Publication Date: 2025-01-02
- Inventor: Kaichien Tsai , Boyu Shen , Zhongyan Sheng
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Main IPC: G01N15/02
- IPC: G01N15/02 ; G01N15/06

Abstract:
Techniques are described herein for air quality sensing. In some examples, the techniques are implemented as an apparatus including first and second light sources, a light detector having a detector output, and a processing circuit having a processing input coupled to the detector output and a processing output. The first light source is configured to generate a first light signal having a first wavelength. The second light source is configured to generate a second light signal having a second wavelength different from the first wavelength. The light detector is configured to generate a first detection signal at the detector output responsive to the first light signal and a second detection signal at the detector output responsive to the second light signal. The processing circuit is configured to generate a third signal representative of an air quality measurement at the processing output responsive to the first and second detection signals.
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