Invention Publication
- Patent Title: EPITAXIAL BACKSIDE CONTACT
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Application No.: US18771503Application Date: 2024-07-12
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Publication No.: US20240363704A1Publication Date: 2024-10-31
- Inventor: Chia-Hung Chu , Tsungyu Hung , Hsu-Kai Chang , Ding-Kang Shih , Keng-Chu Lin , Pang-Yen Tsai , Sung-Li Wang , Shuen-Shin Liang
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Main IPC: H01L29/417
- IPC: H01L29/417 ; H01L21/02 ; H01L21/285 ; H01L23/528 ; H01L29/06 ; H01L29/423 ; H01L29/45 ; H01L29/66 ; H01L29/786

Abstract:
A semiconductor device structure according to the present disclosure includes a source feature and a drain feature, at least one channel structure extending between the source feature and the drain feature, a gate structure wrapped around each of the at least one channel structure, a semiconductor layer over the gate structure, a dielectric layer over the semiconductor layer, a doped semiconductor feature extending through the semiconductor layer and the dielectric layer to be in contact with the source feature, a metal contact plug over the doped semiconductor feature, and a buried power rail disposed over the metal contact plug.
Information query
IPC分类: