发明公开
- 专利标题: Hybrid Conductive Structures
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申请号: US18760471申请日: 2024-07-01
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公开(公告)号: US20240355742A1公开(公告)日: 2024-10-24
- 发明人: Cheng-Wei Chang , Chien-Shun Liao , Sung-Li Wang , Shuen-Shin Liang , Shu-Lan Chang , Yi-Ying Liu , Chia-Hung Chu , Hsu-Kai Chang
- 申请人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 申请人地址: TW Hsinchu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsinchu
- 分案原申请号: US16950537 2020.11.17
- 主分类号: H01L23/532
- IPC分类号: H01L23/532 ; H01L21/768 ; H01L23/528
摘要:
The present disclosure describes a method for the fabrication of ruthenium conductive structures over cobalt conductive structures. In some embodiments, the method includes forming a first opening in a dielectric layer to expose a first cobalt contact and filling the first opening with ruthenium metal to form a ruthenium contact on the first cobalt contact. The method also includes forming a second opening in the dielectric layer to expose a second cobalt contact and a gate structure and filling the second opening with tungsten to form a tungsten contact on the second cobalt contact and the gate structure. Further, the method includes forming a copper conductive structure on the ruthenium contact and the tungsten contact, where the copper from the copper conductive structure is in contact with the ruthenium metal from the ruthenium contact.
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