Invention Publication
- Patent Title: Vertical Transistors Occupying Reduced Chip Area and the Methods Forming the Same
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Application No.: US18184085Application Date: 2023-03-15
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Publication No.: US20240312913A1Publication Date: 2024-09-19
- Inventor: Shang-Wen Chang , Cheng-Chi Chuang , Ching-Wei Tsai , Yi-Hsun Chiu , Yu-Xuan Huang
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Main IPC: H01L23/528
- IPC: H01L23/528 ; H01L21/78 ; H01L21/8238 ; H01L27/092 ; H01L29/417 ; H01L29/66 ; H01L29/78

Abstract:
A method includes forming a vertical transistor, and the method includes forming a vertical semiconductor bar over a substrate, forming a gate dielectric and a gate electrode encircling the vertical semiconductor bar, forming a first source/drain region over a top surface of the vertical semiconductor bar, removing the substrate to reveal a bottom surface of the vertical semiconductor bar; and forming a second source/drain region contacting the bottom surface of the vertical semiconductor bar. The method further includes forming a backside power line, with the backside power line being on a bottom side of the vertical semiconductor bar. The backside power line is connected to the second source/drain region.
Information query
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