Invention Publication
- Patent Title: Thermal Dissipation Structures and Methods for Forming Same
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Application No.: US18165772Application Date: 2023-02-07
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Publication No.: US20240266334A1Publication Date: 2024-08-08
- Inventor: Ke-Gang Wen , Liang-Wei Wang , Dian-Hau Chen , Tsung-Chieh Hsiao
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Main IPC: H01L25/10
- IPC: H01L25/10 ; H01L23/00 ; H01L25/00 ; H10B80/00

Abstract:
An integrated semiconductor device is provided. The integrated semiconductor device includes a first semiconductor structure having a first IC, and a second semiconductor structure stacked above the first semiconductor structure and having a second IC. The second semiconductor structure has a first surface facing the first semiconductor structure and a second surface facing away from the first semiconductor structure. The integrated semiconductor device also includes a thermal dissipation structure having a first portion partially through the first IC and a second portion fully through the second semiconductor structure and exposed at the second surface of the second semiconductor structure. The second portion may be outside of the second IC.
Information query
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