Invention Publication
- Patent Title: SYSTEM AND METHOD FOR DETERMINING TWO-DIMENSIONAL PATCHES OF THREE-DIMENSIONAL OBJECT USING MACHINE LEARNING MODELS
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Application No.: US18534578Application Date: 2023-12-09
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Publication No.: US20240193328A1Publication Date: 2024-06-13
- Inventor: Avinash Sharma , Chandradeep Pokhariya , Shanthika Naik , Astitva Srivastava
- Applicant: International Institute of Information Technology, Hyderabad
- Applicant Address: IN Hyderabad
- Assignee: International Institute of Information Technology, Hyderabad
- Current Assignee: International Institute of Information Technology, Hyderabad
- Current Assignee Address: IN Hyderabad
- Priority: IN 2241071267 2022.12.09
- Main IPC: G06F30/27
- IPC: G06F30/27 ; G06F30/10

Abstract:
A method for determining two-dimensional (2D) patches corresponding to a three-dimensional (3D) object using machine learning models for enabling an improved texture mapping process on the 3D object. The method includes (i) receiving mesh of the 3D object, (ii) training first machine learning model by providing correlation between historic vertices with (a) historic faces, and (b) historic vertex normals of historic meshes based on an objective function of patch extraction, (iii) determining, using the first machine learning model, 2D patches by partitioning the mesh until distortion of the mesh reaches threshold distortion, (iv) training second machine learning model using (i) shape-related features of historic 2D patches associated with historic meshes and (ii) an objective function of surface parameterization of the historic 2D patches associated with the historic meshes, and (v) automatically parameterizing each vertex in the 2D patches to 2D points on 2D plane to enable the texture mapping process.
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