- 专利标题: Method for Analyzing Samples Including a High M/Z Cutoff
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申请号: US18282841申请日: 2021-11-18
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公开(公告)号: US20240177987A1公开(公告)日: 2024-05-30
- 发明人: Leigh BEDFORD , Thomas R. COVEY , James HAGER , Bradley B. SCHNEIDER
- 申请人: DH Technologies Development Pte. Ltd.
- 申请人地址: SG Singapore
- 专利权人: DH Technologies Development Pte. Ltd.
- 当前专利权人: DH Technologies Development Pte. Ltd.
- 当前专利权人地址: SG Singapore
- 国际申请: PCT/IB2021/060678 2021.11.18
- 进入国家日期: 2023-09-19
- 主分类号: H01J49/42
- IPC分类号: H01J49/42 ; G01N33/02 ; G01N33/483 ; H01J49/24
摘要:
In one aspect, a method of performing mass spectrometric analysis of a sample, e.g. a food-based sample, is disclosed, which comprises ionizing the sample to generate a plurality of ions, introducing the plurality of ions into a mass filter configured to provide a high m/z cutoff greater than a maximum m/z ratio of ions associated with one or more analytes of interest in the sample so as to allow passage of the analyte ions while inhibiting passage of ions having m/z ratios above said high m/z cutoff, and performing a mass analysis of ions passing through said mass filter. In a related aspect, a mass spectrometer is disclosed, which comprises an atmospheric pressure ion source, a first mass filter, a user interface and a controller.
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