- 专利标题: Selective Formation of Conductor Nanowires
-
申请号: US18413426申请日: 2024-01-16
-
公开(公告)号: US20240153870A1公开(公告)日: 2024-05-09
- 发明人: Chao-Hsien Peng , Hsiang-Huan Lee , Shau-Lin Shue
- 申请人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 申请人地址: TW Hsinchu
- 专利权人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 当前专利权人地址: TW Hsinchu
- 分案原申请号: US14304272 2014.06.13
- 主分类号: H01L23/522
- IPC分类号: H01L23/522 ; H01L21/285 ; H01L21/3213 ; H01L21/768
摘要:
A method includes etching a mandrel layer to form mandrel strips, and selectively depositing metal lines on sidewalls of the mandrel strips. During the selective deposition, top surfaces of the mandrel strips are masked by dielectric masks. The method further includes removing the mandrel layer and the dielectric masks, filling spaces between the metal lines with a dielectric material, forming via openings in the dielectric material, with top surfaces of the metal lines exposed to the via openings, and filling the via openings with a conductive material to form vias.
信息查询
IPC分类: