发明公开
- 专利标题: Optimized Path Planning for Defect Inspection based on Effective Region Coverage
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申请号: US17816778申请日: 2022-08-02
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公开(公告)号: US20240048848A1公开(公告)日: 2024-02-08
- 发明人: Tai Wai David CHIK , Chi Shing WONG
- 申请人: Hong Kong Applied Science and Technology Resrearch Institute Company Limited
- 申请人地址: CN Hong Kong
- 专利权人: Hong Kong Applied Science and Technology Resrearch Institute Company Limited
- 当前专利权人: Hong Kong Applied Science and Technology Resrearch Institute Company Limited
- 当前专利权人地址: CN Hong Kong
- 主分类号: H04N5/232
- IPC分类号: H04N5/232 ; G01N21/95 ; G01N21/88 ; G06T7/73
摘要:
A movable camera travels along an inspection path for optically inspecting an inspection surface of an object for defect detection. In planning the inspection path, a set of viewpoints on the inspection surface is generated. Each viewpoint is associated with a patch, which is a largest area of the inspection surface within a field of view (FOV) of the camera when the camera is located over the viewpoint for capturing an image of FOV. An effective region of the patch is advantageously predicted by a neural network according to a three-dimensional geometric characterization of the patch such that the predicted effective region is valid for defect detection based on the captured image. A valid area is one whose corresponding area on the captured image is not blurred and is neither underexposed nor overexposed. The inspection path is determined according to respective effective regions associated with the set of viewpoints.
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